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Department of Electrical Engineering and Computer Science
Integrated Nano-Systems Laboratory
1. Journal Articles
A 0.8 V Supply- and Temperature-Insensitive Capacitance-to-Digital Converter in 0.18-Mum CMOS
George, Arup K.
;
Lee, Junghyup
;
Kong, Zhi Hui
;
Je, Minkyu
Department of Electrical Engineering and Computer Science
Integrated Nano-Systems Laboratory
1. Journal Articles
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Title
A 0.8 V Supply- and Temperature-Insensitive Capacitance-to-Digital Converter in 0.18-Mum CMOS
Issued Date
2016-07
Citation
IEEE Sensors Journal, v.16, no.13, pp.5354 - 5364
Type
Article
Author Keywords
Capacitive sensor
;
sensor interface
;
capacitance-to-digital converter
;
low-power
;
low-voltage
;
relaxation oscillator
;
MEMS
Keywords
Capacitance
;
Capacitance-to-Digital Converter
;
Capacitive Sensor
;
Capacitive Sensors
;
CMOS Integrated Circuits
;
COMPENSATION
;
DESIGN
;
Digital Converters
;
Frequency Converters
;
FRONT-END
;
Low-Power
;
Low-Voltage
;
Low Power
;
Low Voltages
;
MemS
;
Oscillators (Electronic)
;
Relaxation Oscillator
;
Relaxation Oscillators
;
Sensor Interface
;
TemPERATURE
;
Temperature-Insensitive
;
Temperature Dependent
;
Temperature Distribution
;
Temperature Variation
ISSN
1530-437X
Abstract
A low-voltage, low-power, capacitance-to-digital converter (CDC) that is insensitive to supply and temperature variations is presented in this paper. The CDC comprises two matched RC oscillators and a counter-based programmable digital converter. The transfer function of the proposed CDC is a scaled ratio of the capacitors having equal drift coefficients, making it insensitive to supply as well as temperature variations. Worst case temperature-dependent drift of ±153.4 ppm/°C is measured between -40 and +120 °C while worst case supply-dependent drift of ±1.12% is measured between 0.8 and 1.2 V over full-scale capacitance range. The proposed CDC achieves 2.05 fF resolution, consuming 23 μA from a 0.8 V supply, at a full-scale range of 3.36 pF. The CDC, realized in 0.18-μm CMOS process, has an active area of 0.102 mm2 and offers a scalable resolution within a range of 2-13 b. © 2016 IEEE.
URI
http://hdl.handle.net/20.500.11750/2242
DOI
10.1109/JSEN.2016.2559164
Publisher
Institute of Electrical and Electronics Engineers Inc.
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Lee, Junghyup
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