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dc.contributor.author Park, Ji-Sang -
dc.contributor.author Kang, Joongoo -
dc.contributor.author Yang, Ji-Hui -
dc.contributor.author Metzger, Wyatt -
dc.contributor.author Wei, Su-Huai -
dc.date.available 2017-07-05T08:50:35Z -
dc.date.created 2017-04-10 -
dc.date.issued 2015-01-15 -
dc.identifier.issn 1367-2630 -
dc.identifier.uri http://hdl.handle.net/20.500.11750/2352 -
dc.description.abstract Using first-principles density functional calculations, we investigate the relative stability and electronic structure of the grain boundaries (GBs) in zinc-blende CdTe. Among the low-Σ-value symmetric tilt Σ3 (111), Σ3 (112), Σ5 (120), and Σ5 (130) GBs, we show that the Σ3 (111) GB is always the most stable due to the absence of dangling bonds and wrong bonds. The Σ5 (120) GBs, however, are shown to be more stable than the Σ3 (112) GBs, even though the former has a higher Σ value, and the latter is often used as a model system to study GB effects in zinc-blende semiconductors. Moreover, we find that although containing wrong bonds, the Σ5 (120) GBs are electrically benign due to the short wrong bond lengths, and thus are not as harmful as the Σ3 (112) GBs also having wrong bonds but with longer bond lengths. © 2015 IOP Publishing Ltd and Deutsche Physikalische Gesellschaft. -
dc.publisher Institute of Physics Publishing -
dc.title Stability and electronic structure of the low-Sigma grain boundaries in CdTe: a density functional study -
dc.type Article -
dc.identifier.doi 10.1088/1367-2630/17/1/013027 -
dc.identifier.scopusid 2-s2.0-84922262120 -
dc.identifier.bibliographicCitation New Journal of Physics, v.17 -
dc.subject.keywordAuthor grain bondaries -
dc.subject.keywordAuthor II-VI semiconductors -
dc.subject.keywordAuthor impurity and defect levels in semiconductors -
dc.subject.keywordAuthor radiation effects in semiconductors -
dc.citation.title New Journal of Physics -
dc.citation.volume 17 -
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ETC 1. Journal Articles
Department of Electrical Engineering and Computer Science ETC 1. Journal Articles

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