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Electrical properties of polycrystalline and single crystalline nickel layer capped ZnO nanowires

Title
Electrical properties of polycrystalline and single crystalline nickel layer capped ZnO nanowires
Author(s)
Mudusu, DevikaNandanapalli, Koteeswara R.Dugasani, Sreekantha R.Kang, Jang-WonPark, Sung-HaTu, Charles W.
Issued Date
2017-12
Citation
Current Applied Physics, v.17, no.12, pp.1699 - 1706
Type
Article
Author Keywords
Electrical propertiesFunctionalized ZnO nanowiresMOSFET devicesPhotoanodes for PEC devicesVapor-liquid-solid processZnO/Ni core/shell nanowires
Keywords
FIELD-EFFECT-TRANSISTORSLIGHT-EMITTING DIODESURFACE PASSIVATIONVAPOR-DEPOSITIONHFO2 FILMSNANORODSNANOSTRUCTURESPERFORMANCETRANSPORTENHANCEMENT
ISSN
1567-1739
Abstract
This article reports the electrical characteristics of pristine, polycrystalline and single crystalline nickel (Ni) layer capped zinc oxide (ZnO) nanowires. Core/shell ZnO/Ni nanostructures were developed using chemical vapor deposition and e-beam evaporation, and the structures were annealed at different temperatures. Field effect transistor (FET) devices were fabricated using photolithography and investigated their characteristics at room temperature. All FET devices exhibited depletion-mode characteristics with n-type conductivity. However, single-crystalline Ni shelled ZnO nanowires based FET devices showed a high on/off ratio and transconductance, as compared to other devices. The overall measurements show that though the ZnO nanowires capped with Ni layer, their electrical properties remain same as pristine ZnO nanowires. © 2017 Elsevier B.V.
URI
http://hdl.handle.net/20.500.11750/4605
DOI
10.1016/j.cap.2017.09.002
Publisher
Elsevier B.V.
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