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Leakage Current and Threshold Voltage Characteristics of a-Si:H TFTs through Depending on Processing Conditions
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Title
Leakage Current and Threshold Voltage Characteristics of a-Si:H TFTs through Depending on Processing Conditions
Issued Date
2013-11-15
Citation
Yang, Kee-Jeong. (2013-11-15). Leakage Current and Threshold Voltage Characteristics of a-Si:H TFTs through Depending on Processing Conditions. ICAE 2013.
Type
Conference Paper
URI
http://hdl.handle.net/20.500.11750/47383
Publisher
KIEEME
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Yang, Kee-Jeong양기정

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