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One-step and controllable bipolar doping of reduced graphene oxide using TMAH as reducing agent and doping source for field effect transistors
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- Title
- One-step and controllable bipolar doping of reduced graphene oxide using TMAH as reducing agent and doping source for field effect transistors
- Issued Date
- 2016-04
- Citation
- Khan, Firoz. (2016-04). One-step and controllable bipolar doping of reduced graphene oxide using TMAH as reducing agent and doping source for field effect transistors. Carbon, 100, 608–616. doi: 10.1016/j.carbon.2016.01.064
- Type
- Article
- Keywords
- Ammonium Hydroxide ; Carrier Concentration ; CHemICAL-VAPOR-DEPOSITION ; DEGRADATION ; Electron Withdrawing Group ; Field-Effect Devices ; Field Effect Transistors ; FILMS ; Flexible Electronic Devices ; Graphene ; Graphene Transistors ; GRAPHITE OXIDE ; Low Temperature Method ; Low Temperature Production ; Low Temperatures ; NITROGEN-DOPED GRAPHENE ; RAMAN ; Reduced Graphene Oxides ; REDUCTION ; SHEETS ; Simultaneous Reduction ; TemPERATURE ; Tetramethyl Ammonium Hydroxide ; TRANSPARENT ELECTRODES ; WORK-FUNCTION ; Work Function
- ISSN
- 0008-6223
- Abstract
-
Simultaneous reduction and doping of the graphene oxide (GO) is an important issue for low temperature processed flexible electronic devices. A low temperature method for reduction and ambipolar doping has been developed which yield the doped reduced GO with wide range of work function with a mass production using tetra-methyl ammonium hydroxide (TMAH). The doping type of obtained reduced GO is tuned with TMAH concentration. XPS analysis revealed that the graphitic N is converted to oxidized N with increase of TMAH concentration. The work function is tuned via wide range variation in the carrier concentration in neutral (rGO-A, 4.46 eV), n-type (rGO-B, 3.90 eV) and p-type (rGO-C, 5.29 eV) regimes. The obtained Dirac voltages of field effect devices are -1 V, -31 V and +35 V with active layer of rGO-A, rGO-B and rGO-C, respectively. The n-type doping is due to incorporation of graphitic N, whereas, oxidized N acts as electron withdrawing group which causes p-type doping. © 2016 Elsevier Ltd. All rights reserved.
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- Publisher
- Elsevier Ltd
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