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Suppression of Thermally Induced Surface Traps in Colloidal Quantum Dot Solids via Ultrafast Pulsed Light
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Title
Suppression of Thermally Induced Surface Traps in Colloidal Quantum Dot Solids via Ultrafast Pulsed Light
Issued Date
2024-09
Citation
Lee, Eon Ji. (2024-09). Suppression of Thermally Induced Surface Traps in Colloidal Quantum Dot Solids via Ultrafast Pulsed Light. Small, 20(36). doi: 10.1002/smll.202400380
Type
Article
Author Keywords
PbS colloidal quantum dotssolar cellsflashlight annealinghydroxylationoxidation
Keywords
STATESSOLAR-CELLSTHIN-FILMSPHOTOVOLTAICSHYDROXYLATIONPERFORMANCE
ISSN
1613-6810
Abstract
Thermal annealing (TA) of colloidal quantum dot (CQD) films is considered an important process for recent high-performing CQD solar cells (SCs) due to its beneficial effects on CQD solids, including enhanced electrical conductivity, denser packing of CQD films, and the removal of organic residues and solvents. However, the conventional TA for CQDs, which requires several minutes, leads to hydroxylation and oxidation on the CQD surface, resulting in the formation of trap states and a subsequent decline in SC performance. To address these challenges, this study introduces a flashlight annealing (FLA) technique that significantly reduces the annealing time to the millisecond scale. Through the FLA approach, it successfully suppressed hydroxylation and oxidation, resulting in decreased trap states within the CQD solids while simultaneously preserving their charge transport properties. As a result, CQD SCs treated with FLA exhibited a notable improvement, achieving an open-circuit voltage of 0.66 V compared to 0.63 V in TA-treated devices, leading to an increase in power conversion efficiency from 12.71% to 13.50%. © 2024 Wiley-VCH GmbH.
URI
http://hdl.handle.net/20.500.11750/56904
DOI
10.1002/smll.202400380
Publisher
Wiley
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최종민
Choi, Jongmin최종민

Department of Energy Science and Engineering

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