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PDAF Pixel with Plasmonic Nanostructures
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dc.contributor.author Seok, Godeun -
dc.contributor.author An, Sung Jin -
dc.contributor.author Lee, Myoung-Jae -
dc.contributor.author Kim, Yunkyung -
dc.date.accessioned 2025-04-16T14:40:17Z -
dc.date.available 2025-04-16T14:40:17Z -
dc.date.created 2025-03-13 -
dc.date.issued 2025-04 -
dc.identifier.issn 1530-437X -
dc.identifier.uri http://hdl.handle.net/20.500.11750/58298 -
dc.description.abstract Sub-micron pixel pitch of CMOS image sensors improves the resolution and functionality of image sensors. To achieve the high optical performance of sensors, optical characteristics, such as sensitivity and crosstalk, should be satisfied. However, due to the trade-offs between resolution and sensitivity, it is necessary to enhance the aspect ratio of pixel structures. In this study, we propose a phase detection auto-focus (PDAF) pixel with a plasmonic nanostructure. Not only the wavelength selectivity but also the incident angle dependency of the proposed structure is adapted for the PDAF function. We fabricated the metal-insulator-metal (MIM) structure above the photodetector for red and near-infrared (NIR) pixels. Sensitivity was measured, and the angular response for the auto-focus (AF) function was confirmed. Moreover, the AF contrast, which verifies the performance of the AF pixel, was calculated to be 2.2 at the red pixel and 2.7 at the NIR pixel. The experimental results confirmed that the suggested MIM structure is effective for PDAF pixels. © IEEE. -
dc.language English -
dc.publisher Institute of Electrical and Electronics Engineers -
dc.title PDAF Pixel with Plasmonic Nanostructures -
dc.type Article -
dc.identifier.doi 10.1109/JSEN.2025.3534230 -
dc.identifier.wosid 001457747000040 -
dc.identifier.scopusid 2-s2.0-85218712255 -
dc.identifier.bibliographicCitation Seok, Godeun. (2025-04). PDAF Pixel with Plasmonic Nanostructures. IEEE Sensors Journal, 25(7), 10934–10941. doi: 10.1109/JSEN.2025.3534230 -
dc.description.isOpenAccess FALSE -
dc.subject.keywordAuthor plasmonic nanostructures -
dc.subject.keywordAuthor CMOS image sensor -
dc.subject.keywordAuthor metal-insulator–metal (MIM) -
dc.subject.keywordAuthor phase detection autofocus (PDAF) -
dc.citation.endPage 10941 -
dc.citation.number 7 -
dc.citation.startPage 10934 -
dc.citation.title IEEE Sensors Journal -
dc.citation.volume 25 -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.relation.journalResearchArea Engineering; Instruments & Instrumentation; Physics -
dc.relation.journalWebOfScienceCategory Engineering, Electrical & Electronic; Instruments & Instrumentation; Physics, Applied -
dc.type.docType Article -
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