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Division of Nanotechnology
1. Journal Articles
PDAF Pixel with Plasmonic Nanostructures
Seok, Godeun
;
An, Sung Jin
;
Lee, Myoung-Jae
;
Kim, Yunkyung
Division of Nanotechnology
1. Journal Articles
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Title
PDAF Pixel with Plasmonic Nanostructures
Issued Date
2025-04
Citation
Seok, Godeun. (2025-04). PDAF Pixel with Plasmonic Nanostructures. IEEE Sensors Journal, 25(7), 10934–10941. doi: 10.1109/JSEN.2025.3534230
Type
Article
Author Keywords
plasmonic nanostructures
;
CMOS image sensor
;
metal-insulator–metal (MIM)
;
phase detection autofocus (PDAF)
ISSN
1530-437X
Abstract
Sub-micron pixel pitch of CMOS image sensors improves the resolution and functionality of image sensors. To achieve the high optical performance of sensors, optical characteristics, such as sensitivity and crosstalk, should be satisfied. However, due to the trade-offs between resolution and sensitivity, it is necessary to enhance the aspect ratio of pixel structures. In this study, we propose a phase detection auto-focus (PDAF) pixel with a plasmonic nanostructure. Not only the wavelength selectivity but also the incident angle dependency of the proposed structure is adapted for the PDAF function. We fabricated the metal-insulator-metal (MIM) structure above the photodetector for red and near-infrared (NIR) pixels. Sensitivity was measured, and the angular response for the auto-focus (AF) function was confirmed. Moreover, the AF contrast, which verifies the performance of the AF pixel, was calculated to be 2.2 at the red pixel and 2.7 at the NIR pixel. The experimental results confirmed that the suggested MIM structure is effective for PDAF pixels. © IEEE.
URI
http://hdl.handle.net/20.500.11750/58298
DOI
10.1109/JSEN.2025.3534230
Publisher
Institute of Electrical and Electronics Engineers
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