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MATERIAL MEASUREMENT DEVICE, MATERIAL MEASUREMENT SYSTEM, AND MATERIAL MEASUREMENT METHOD
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dc.contributor.author 장일류 -
dc.contributor.author 정순인 -
dc.contributor.author 김회준 -
dc.date.accessioned 2025-07-24T19:40:14Z -
dc.date.available 2025-07-24T19:40:14Z -
dc.identifier.uri https://scholar.dgist.ac.kr/handle/20.500.11750/58717 -
dc.description.abstract The present invention relates to a surface acoustic wave-based material measurement device, a material measurement system, and a material measurement method, and relates to a technology capable of, by generating multiple resonant waves, accurately and reliably measuring various unique properties of a temperature and frequency dependent material. -
dc.title MATERIAL MEASUREMENT DEVICE, MATERIAL MEASUREMENT SYSTEM, AND MATERIAL MEASUREMENT METHOD -
dc.title.alternative Material Instrumentation Sensor, Material Instrumentation System and Material Instrumentation Method -
dc.type Patent -
dc.identifier.bibliographicCitation 장일류. MATERIAL MEASUREMENT DEVICE, MATERIAL MEASUREMENT SYSTEM, AND MATERIAL MEASUREMENT METHOD. -
dc.publisher.country UN -
dc.identifier.patentApplicationNumber PCT/KR2021/017590 -
dc.date.application 2021-11-26 -
dc.identifier.patentRegistrationNumber 2022186453 -
dc.date.registration 2022-09-09 -
dc.contributor.assignee DAEGU GYEONGBUK INSTITUTE OF SCIENCE AND TECHNOLOGY,재단법인대구경북과학기술원 -
dc.type.iprs 특허 -
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김회준
Kim, Hoe Joon김회준

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