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물질 계측 센서, 물질 계측 시스템 및 물질 계측 방법
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 장일류 | - |
| dc.contributor.author | 김회준 | - |
| dc.date.accessioned | 2026-04-15T17:11:32Z | - |
| dc.date.available | 2026-04-15T17:11:32Z | - |
| dc.identifier.uri | https://scholar.dgist.ac.kr/handle/20.500.11750/60242 | - |
| dc.title | 물질 계측 센서, 물질 계측 시스템 및 물질 계측 방법 | - |
| dc.title.alternative | MATERIAL MEASURING DEVICE, MATERIAL MEASURING SYSTEM AND MATERIAL MEASURING METHOD | - |
| dc.type | Patent | - |
| dc.publisher.country | US | - |
| dc.identifier.patentApplicationNumber | 18/279,964 | - |
| dc.date.application | 2023-09-05 | - |
| dc.identifier.patentRegistrationNumber | 12,584,885 | - |
| dc.date.registration | 2026-03-24 | - |
| dc.contributor.assignee | (재)대구경북과학기술원(100/100) | - |
| dc.type.iprs | 특허 | - |
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