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dc.contributor.author 김회준 -
dc.contributor.author 장일류 -
dc.date.accessioned 2026-07-01T02:10:31Z -
dc.date.available 2026-07-01T02:10:31Z -
dc.identifier.uri https://scholar.dgist.ac.kr/handle/20.500.11750/60444 -
dc.title 입자 측정장치 및 이의 제조방법 -
dc.title.alternative PARTICLE MEASURING APPARATUS AND MANUFACTURING METHOD THEREOF -
dc.type Patent -
dc.publisher.country US -
dc.identifier.patentApplicationNumber 18/279,542 -
dc.date.application 2023-08-30 -
dc.identifier.patentRegistrationNumber 12,650,373 -
dc.date.registration 2026-06-09 -
dc.contributor.assignee (재)대구경북과학기술원(100/100) -
dc.type.iprs 특허 -
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김회준
Kim, Hoe Joon김회준

Department of Robotics and Mechatronics Engineering

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