Department of Physics and Chemistry
Multifunctional films and nanostructures Lab
1. Journal Articles
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Choi, Songhee | - |
| dc.contributor.author | Chang, Sung-Jin | - |
| dc.contributor.author | Oh, Junhyeob | - |
| dc.contributor.author | Jang, Jae Hyuck | - |
| dc.contributor.author | Lee, Shin Buhm | - |
| dc.date.accessioned | 2018-05-25T02:25:44Z | - |
| dc.date.available | 2018-05-25T02:25:44Z | - |
| dc.date.created | 2018-05-14 | - |
| dc.date.issued | 2018-06 | - |
| dc.identifier.citation | Advanced Electronic Materials, v.4, no.6 | - |
| dc.identifier.issn | 2199-160X | - |
| dc.identifier.uri | http://hdl.handle.net/20.500.11750/6384 | - |
| dc.description.abstract | Vanadium dioxide (VO2) polymorphs have many interesting physical and chemical properties that are crystal-structure dependent. It is reported that polymorphic (010)VO2(M1), (100)VO2(A), and (100)VO2(B) can be epitaxially grown on (001)-, (011)-, and (111)-oriented Y-stabilized ZrO2 (YSZ), respectively. While VO2(M1) shows a typical metal-insulator transition near 68 °C, and VO2(B) exhibits insulating behavior, the resistivity of VO2(A) is lower by three orders of magnitude than that of (100)VO2(A) epitaxial films previously grown on (011)SrTiO3. Ellipsometry reveals that the bandgap of VO2(A) also decreases. Each VO2 polymorphic film grown on cost-effective YSZ will be of great interest for numerous electronic and energy applications. © 2018 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. | - |
| dc.language | English | - |
| dc.publisher | Wiley-VCH Verlag | - |
| dc.title | Electrical and optical properties of VO2 polymorphic films grown epitaxially on Y-stabilized ZrO2 | - |
| dc.type | Article | - |
| dc.identifier.doi | 10.1002/aelm.201700620 | - |
| dc.identifier.wosid | 000434944500005 | - |
| dc.identifier.scopusid | 2-s2.0-85046087349 | - |
| dc.type.local | Article(Overseas) | - |
| dc.type.rims | ART | - |
| dc.description.journalClass | 1 | - |
| dc.citation.publicationname | Advanced Electronic Materials | - |
| dc.contributor.nonIdAuthor | Choi, Songhee | - |
| dc.contributor.nonIdAuthor | Chang, Sung-Jin | - |
| dc.contributor.nonIdAuthor | Oh, Junhyeob | - |
| dc.contributor.nonIdAuthor | Jang, Jae Hyuck | - |
| dc.identifier.citationVolume | 4 | - |
| dc.identifier.citationNumber | 6 | - |
| dc.identifier.citationTitle | Advanced Electronic Materials | - |
| dc.type.journalArticle | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.subject.keywordAuthor | Electrical resistivity | - |
| dc.subject.keywordAuthor | Epitaxial films | - |
| dc.subject.keywordAuthor | Optical conductivity | - |
| dc.subject.keywordAuthor | VO2 polymorphs | - |
| dc.subject.keywordAuthor | Y-stabilized ZrO2 | - |
| dc.subject.keywordPlus | METAL-INSULATOR-TRANSITION | - |
| dc.subject.keywordPlus | PHASE-TRANSITION | - |
| dc.subject.keywordPlus | THIN-FILMS | - |
| dc.contributor.affiliatedAuthor | Choi, Songhee | - |
| dc.contributor.affiliatedAuthor | Chang, Sung-Jin | - |
| dc.contributor.affiliatedAuthor | Oh, Junhyeob | - |
| dc.contributor.affiliatedAuthor | Jang, Jae Hyuck | - |
| dc.contributor.affiliatedAuthor | Lee, Shin Buhm | - |
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