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Department of Physics and Chemistry
Semiconductor Energy Sensor Laboratory
1. Journal Articles
Electrical and optical properties of VO2 polymorphic films grown epitaxially on Y-stabilized ZrO2
Choi, Songhee
;
Chang, Sung-Jin
;
Oh, Junhyeob
;
Jang, Jae Hyuck
;
Lee, Shin Buhm
Department of Physics and Chemistry
Semiconductor Energy Sensor Laboratory
1. Journal Articles
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Title
Electrical and optical properties of VO2 polymorphic films grown epitaxially on Y-stabilized ZrO2
DGIST Authors
Choi, Songhee
;
Chang, Sung-Jin
;
Oh, Junhyeob
;
Jang, Jae Hyuck
;
Lee, Shin Buhm
Issued Date
2018-06
Citation
Choi, Songhee. (2018-06). Electrical and optical properties of VO2 polymorphic films grown epitaxially on Y-stabilized ZrO2. doi: 10.1002/aelm.201700620
Type
Article
Article Type
Article
Author Keywords
Electrical resistivity
;
Epitaxial films
;
Optical conductivity
;
VO2 polymorphs
;
Y-stabilized ZrO2
Keywords
METAL-INSULATOR-TRANSITION
;
PHASE-TRANSITION
;
THIN-FILMS
ISSN
2199-160X
Abstract
Vanadium dioxide (VO2) polymorphs have many interesting physical and chemical properties that are crystal-structure dependent. It is reported that polymorphic (010)VO2(M1), (100)VO2(A), and (100)VO2(B) can be epitaxially grown on (001)-, (011)-, and (111)-oriented Y-stabilized ZrO2 (YSZ), respectively. While VO2(M1) shows a typical metal-insulator transition near 68 °C, and VO2(B) exhibits insulating behavior, the resistivity of VO2(A) is lower by three orders of magnitude than that of (100)VO2(A) epitaxial films previously grown on (011)SrTiO3. Ellipsometry reveals that the bandgap of VO2(A) also decreases. Each VO2 polymorphic film grown on cost-effective YSZ will be of great interest for numerous electronic and energy applications. © 2018 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
URI
http://hdl.handle.net/20.500.11750/6384
DOI
10.1002/aelm.201700620
Publisher
Wiley-VCH Verlag
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