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The Effect of In situ Magnetic Field on Magnetic Properties and Residual Stress of Fe-Based Amorphous Film
- The Effect of In situ Magnetic Field on Magnetic Properties and Residual Stress of Fe-Based Amorphous Film
- Wang, Sibo; Kim, Hoe Joon; Chen, Jun; Laughlin, Devid E.; Piazza, Gianluca; Zhu, Jingxi
- DGIST Authors
- Kim, Hoe Joon
- Issue Date
- IEEE Transactions on Magnetics, 54(6), 1-8
- Article Type
- Author Keywords
- Anisotropy; coercivity; in situ field; magnetostriction; residual stress
- Fe-based amorphous thin films of two compositions (Fe₈₀ and Fe65.6Co9.4B25) were deposited by RF magnetron sputtering with and without applying an in situ magnetic field along the films' in-plane direction. In addition, films with varying thickness were deposited for each composition. Hysteresis loops and residual stress were measured and compared to study the effect of in situ fields on the magnetic and magnetostrictive behavior of the films. Results showed that in situ magnetic fields can lower the in-plane coercivity for the Fe₈₀ films. Also, when the residual stress was below a certain level, its distribution in different directions shows a uniaxial feature due to the applied in situ field. This uniaxial distribution of stress adds an extra magnetoelastic anisotropy to the films. This paper provides insight for optimizing magnetic thin films' properties for applications where the magnetostriction is relevant, in terms of the in situ magnetic field, coercivity, and residual stress. IEEE
- Institute of Electrical and Electronics Engineers Inc.
- Related Researcher
Kim, Hoe Joon
Nano Materials and Devices Lab
MEMS/NEMS; Micro/Nano Sensors; Piezoelectric Devices; Nanomaterials; Heat Transfer; Atomic Force Microscope
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