Communities & Collections
Researchers & Labs
Titles
DGIST
LIBRARY
DGIST R&D
Detail View
(Legacy) Magnet-Controlled Materials Research Group
1. Journal Articles
The interfacial resistances of thermoelectric device from the I-V measurement
Kim, Dong Hwan
;
Kim, Cham
;
Kim, Jong Tae
;
Baek, Ju Young
;
Kim, Ho Young
ETC
1. Journal Articles
(Legacy) Magnet-Controlled Materials Research Group
1. Journal Articles
Citations
WEB OF SCIENCE
Citations
SCOPUS
Metadata Downloads
XML
Excel
Title
The interfacial resistances of thermoelectric device from the I-V measurement
DGIST Authors
Kim, Dong Hwan
;
Kim, Cham
;
Kim, Ho Young
Issued Date
2016
Citation
Kim, Dong Hwan. (2016). The interfacial resistances of thermoelectric device from the I-V measurement.
Type
Article
ISSN
1882-2630
URI
http://hdl.handle.net/20.500.11750/6479
Publisher
Thermoelectric Society of Japan
Show Full Item Record
File Downloads
There are no files associated with this item.
공유
공유하기
Related Researcher
Kim, Dong Hwan
김동환
Division of Nanotechnology
read more
Total Views & Downloads