1. Journal Articles86

Showing results 81 to 86 of 86

  • 2016-11
  • Choi, Hyeok-Cheol. (2016-11). Azimuthal angular dependent hysteresis loops of Fe50Mn50/Ni81Fe19 bilayers grown under a magnetic field. Journal of Applied Physics, 120(17). doi: 10.1063/1.4966935
  • American Institute of Physics Publishing
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  • Kim, Nam-Hui ; 
  • Jung, Jinyong ; 
  • Cho, Jaehun ; 
  • Han, Dong-Soo ; 
  • Yin, Yuxiang ; 
  • Kim, June-Seo ; 
  • Swagten, Henk J. M. ; 
  • You, Chun-Yeol
  • 2016-04
  • Kim, Nam-Hui. (2016-04). Interfacial Dzyaloshinskii-Moriya interaction, surface anisotropy energy, and spin pumping at spin orbit coupled Ir/Co interface. Applied Physics Letters, 108(14). doi: 10.1063/1.4945685
  • American Institute of Physics Publishing
  • View : 1277
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  • 2016-12
  • Kim, Hyungsuk. (2016-12). Embedded Object-Oriented Micromagnetic Frame (OOMMF) for More Flexible Micromagnetic Simulations. Journal of Magnetics, 21(4), 491–495. doi: 10.4283/JMAG.2016.21.4.491
  • Korean Magnetics Society
  • View : 989
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  • Song, Hyon-Seok ; 
  • Lee, Kyeong-Dong ; 
  • Yang, See-Hun ; 
  • Sohn, Jeong-Woo ; 
  • Kim, Hyun Joong ; 
  • You, Chun-Yeol ; 
  • Park, Byong-Guk ; 
  • Parkin, Stuart ; 
  • Shin, Sung-Chul ; 
  • Hong, Jung-Il
  • 2016-10
  • Song, Hyon-Seok. (2016-10). Effect of microstructures on the Gilbert damping in Co/Ni multilayers. doi: 10.1016/j.cap.2016.08.001
  • Elsevier B.V.
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  • Han, Dong-Soo ; 
  • Kim, Nam-Hui ; 
  • Kim, June-Seo ; 
  • Yin, Yuxiang ; 
  • Koo, Jung-Woo ; 
  • Cho, Jaehun ; 
  • Lee, Sukmock ; 
  • Klaeui, Mathias ; 
  • Swagten, Henk J. M. ; 
  • Koopmans, Bert ; 
  • et al
  • 2016-07
  • Han, Dong-Soo. (2016-07). Asymmetric Hysteresis for Probing Dzyaloshinskii-Moriya Interaction. Nano Letters, 16(7), 4438–4446. doi: 10.1021/acs.nanolett.6b01593
  • American Chemical Society
  • View : 1269
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  • Cha, In Ho ; 
  • Kim, Nam Hui ; 
  • Kim, Yong Jin ; 
  • Kim, Gyu Won ; 
  • You, Chun Yeol ; 
  • Kim, Young Keun
  • 2017-10
  • IEEE Magnetics Letters, v.8
  • Institute of Electrical and Electronics Engineers Inc.
  • View : 944
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