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전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

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Conference
TEST: Testing Environment for Embedded Systems Based on TTCN-3 in SILS
  • Chae, Hochang ; 
  • Jin, Xiulin ; 
  • Lee, Seonghun ; 
  • Cho, Jeonghun
  • 2009-12-10
  • Chae, Hochang. (2009-12-10). TEST: Testing Environment for Embedded Systems Based on TTCN-3 in SILS. International Conference on Advanced Software Engineering and Its Applications, 204–212. doi: 10.1007/978-3-642-10619-4_25
  • SPRINGER-VERLAG BERLIN
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