TEST: Testing Environment for Embedded Systems Based on TTCN-3 in SILS

Abstract

The Testing and Test Control Notation Version 3 (TTCN-3) is an internationally standardized language for defining test specifications for a wide range of computer and telecommunication systems. Since embedded systems software is frequently used in case that safety is a primary issue and reliability is critical in the systems, it is necessary for the embedded systems software to use a systematic testing method such as TTCN-3. Unfortunately, the difference of testing environment between embedded and PC-based software makes developers hard to test the software, and hence products not tested thoroughly could be released in the market, which can be a potential disaster. In this paper, we review the TTCN-3 testing system and suggest a modified TTCN-3 testing environment for embedded systems software in Software In the Loop Simulation (SILS). A simple example shows our demonstration of testing embedded systems software based on the proposed TTCN-3 testing system.