Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chae, Hochang | - |
dc.contributor.author | Jin, Xiulin | - |
dc.contributor.author | Lee, Seonghun | - |
dc.contributor.author | Cho, Jeonghun | - |
dc.date.accessioned | 2023-12-26T22:11:27Z | - |
dc.date.available | 2023-12-26T22:11:27Z | - |
dc.date.created | 2022-06-16 | - |
dc.date.issued | 2009-12-10 | - |
dc.identifier.isbn | 9783642106187 | - |
dc.identifier.issn | 1865-0929 | - |
dc.identifier.uri | http://hdl.handle.net/20.500.11750/47475 | - |
dc.description.abstract | The Testing and Test Control Notation Version 3 (TTCN-3) is an internationally standardized language for defining test specifications for a wide range of computer and telecommunication systems. Since embedded systems software is frequently used in case that safety is a primary issue and reliability is critical in the systems, it is necessary for the embedded systems software to use a systematic testing method such as TTCN-3. Unfortunately, the difference of testing environment between embedded and PC-based software makes developers hard to test the software, and hence products not tested thoroughly could be released in the market, which can be a potential disaster. In this paper, we review the TTCN-3 testing system and suggest a modified TTCN-3 testing environment for embedded systems software in Software In the Loop Simulation (SILS). A simple example shows our demonstration of testing embedded systems software based on the proposed TTCN-3 testing system. | - |
dc.language | English | - |
dc.publisher | SPRINGER-VERLAG BERLIN | - |
dc.title | TEST: Testing Environment for Embedded Systems Based on TTCN-3 in SILS | - |
dc.type | Conference Paper | - |
dc.identifier.doi | 10.1007/978-3-642-10619-4_25 | - |
dc.identifier.bibliographicCitation | International Conference on Advanced Software Engineering and Its Applications, pp.204 - 212 | - |
dc.citation.conferencePlace | KO | - |
dc.citation.conferencePlace | 제주 | - |
dc.citation.endPage | 212 | - |
dc.citation.startPage | 204 | - |
dc.citation.title | International Conference on Advanced Software Engineering and Its Applications | - |
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