Showing results 1 to 2 of 2
- 2018-12
- Lee, Hyeon-Jun. (2018-12). Drain-Induced Barrier Lowering in Oxide Semiconductor Thin-Film Transistors With Asymmetrical Local Density of States. IEEE Journal of the Electron Devices Society, 6(1), 830–834. doi: 10.1109/JEDS.2018.2855731
- Institute of Electrical and Electronics Engineers Inc.
- View : 573
- Download : 49
- 2017-08
- Lee, Hyeon-Jun. (2017-08). Impact of transient currents caused by alternating drain stress in oxide semiconductors. Scientific Reports, 7(1), 9782–9790. doi: 10.1038/s41598-017-10285-2
- Nature Publishing Group
- View : 884
- Download : 127
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