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Showing results 1 to 4 of 4
Issue Date
Title
Author(s)
Article
Evaluation of interfacial resistances for thermoelectric devices
Kim, Dong Hwan
;
Kim, Cham
;
Kim, Jong Tae
;
Yoon, Duck Ki
;
Kim, Ho Young
2017
Kim, Dong Hwan. (2017). Evaluation of interfacial resistances for thermoelectric devices.
Thermoelectric Society of Japan
View : 765
Download : 0
Article
Method for evaluating interfacial resistances of thermoelectric devices using I-V measurement
Kim, Dong Hwan
;
Kim, Cham
;
Kim, Jong Tae
;
Yoon, Duck Ki
;
Kim, Hoyoung
2018-12
Kim, Dong Hwan. (2018-12). Method for evaluating interfacial resistances of thermoelectric devices using I-V measurement. doi: 10.1016/j.measurement.2018.07.030
Elsevier B.V.
View : 3736
Download : 0
Article
Reversible carrier-type transition in Sn-Se thermoelectric materials
Kim, Dong Hwan
;
An, Ji Hyeon
;
Kim, Jong Tae
;
Baek, Ju Young
;
Kim, Cham
;
Kim, Ho Young
2016
Kim, Dong Hwan. (2016). Reversible carrier-type transition in Sn-Se thermoelectric materials.
Thermoelectric Society of Japan
View : 686
Download : 0
Article
The interfacial resistances of thermoelectric device from the I-V measurement
Kim, Dong Hwan
;
Kim, Cham
;
Kim, Jong Tae
;
Baek, Ju Young
;
Kim, Ho Young
2016
Kim, Dong Hwan. (2016). The interfacial resistances of thermoelectric device from the I-V measurement.
Thermoelectric Society of Japan
View : 760
Download : 0
1