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- Kim, Dong Hwan ;
- Kim, Cham ;
- Kim, Jong Tae ;
- Yoon, Duck Ki ;
- Kim, Ho Young
- 2017
- Kim, Dong Hwan. (2017). Evaluation of interfacial resistances for thermoelectric devices.
- Thermoelectric Society of Japan
- View : 785
- Download : 0
Article
Method for evaluating interfacial resistances of thermoelectric devices using I-V measurement
- Kim, Dong Hwan ;
- Kim, Cham ;
- Kim, Jong Tae ;
- Yoon, Duck Ki ;
- Kim, Hoyoung
- 2018-12
- Kim, Dong Hwan. (2018-12). Method for evaluating interfacial resistances of thermoelectric devices using I-V measurement. doi: 10.1016/j.measurement.2018.07.030
- Elsevier B.V.
- View : 3762
- Download : 0
- Kim, Dong Hwan ;
- An, Ji Hyeon ;
- Kim, Jong Tae ;
- Baek, Ju Young ;
- Kim, Cham ;
- Kim, Ho Young
- 2016
- Kim, Dong Hwan. (2016). Reversible carrier-type transition in Sn-Se thermoelectric materials.
- Thermoelectric Society of Japan
- View : 714
- Download : 0
- Kim, Dong Hwan ;
- Kim, Cham ;
- Kim, Jong Tae ;
- Baek, Ju Young ;
- Kim, Ho Young
- 2016
- Kim, Dong Hwan. (2016). The interfacial resistances of thermoelectric device from the I-V measurement.
- Thermoelectric Society of Japan
- View : 788
- Download : 0
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