Browsing by Titles

Showing results 1 to 4 of 4

  • 2017
  • Kim, Dong Hwan. (2017). Evaluation of interfacial resistances for thermoelectric devices.
  • Thermoelectric Society of Japan
  • View : 774
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  • 2018-12
  • Kim, Dong Hwan. (2018-12). Method for evaluating interfacial resistances of thermoelectric devices using I-V measurement. doi: 10.1016/j.measurement.2018.07.030
  • Elsevier B.V.
  • View : 3749
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  • 2016
  • Kim, Dong Hwan. (2016). Reversible carrier-type transition in Sn-Se thermoelectric materials.
  • Thermoelectric Society of Japan
  • View : 696
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  • 2016
  • Kim, Dong Hwan. (2016). The interfacial resistances of thermoelectric device from the I-V measurement.
  • Thermoelectric Society of Japan
  • View : 772
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