Showing results 1 to 5 of 5
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Kim, Youn-Hye
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Kotsugi, Yohei
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Cheon, Taehoon
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Ramesh, Rahul
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Kim, Soo-Hyun
- 2021-07-06
- Kim, Youn-Hye. (2021-07-06). Atomic layer deposition of RuO2 using a new metalorganic precursor as a diffusion barrier for Ru interconnect. 24th Annual IEEE International Interconnect Technology Conference, IITC 2021. doi: 10.1109/IITC51362.2021.9537498
- Institute of Electrical and Electronics Engineers Inc.
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Ramesh, Rahul
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Nandi, Dip K.
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Kim, Tae Hyun
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Cheon, Taehoon
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Oh, Jihun
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Kim, Soo-Hyun
- 2019-05
- Ramesh, Rahul. (2019-05). Atomic-Layer-Deposited MoN x Thin Films on Three-Dimensional Ni Foam as Efficient Catalysts for the Electrochemical Hydrogen Evolution Reaction. doi: 10.1021/acsami.8b20437
- American Chemical Society
- View : 862
- Download : 0
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Ansari, Mohd Zahid
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Parveen, Nazish
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Nandi, Dip K.
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Ramesh, Rahul
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Ansari, Sajid Ali
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Cheon, Taehoon
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Kim, Soo-Hyun
- 2019-07
- Ansari, Mohd Zahid. (2019-07). Enhanced activity of highly conformal and layered tin sulfide (SnSx) prepared by atomic layer deposition (ALD) on 3D metal scaffold towards high performance supercapacitor electrode. doi: 10.1038/s41598-019-46679-7
- Nature Publishing Group
- View : 1019
- Download : 257
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Ansari, Mohd Zahid
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Nandi, Dip K.
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Janicek, Petr
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Ansari, Sajid Ali
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Ramesh, Rahul
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Cheon, Taehoon
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Shong, Bonggeun
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Kim, Soo-Hyun
- 2019-11
- Ansari, Mohd Zahid. (2019-11). Low-Temperature Atomic Layer Deposition of Highly Conformal Tin Nitride Thin Films for Energy Storage Devices. ACS Applied Materials & Interfaces, 11(46), 43608–43621. doi: 10.1021/acsami.9b15790
- American Chemical Society
- View : 842
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Ramesh, Rahul
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Han, Seungmin
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Nandi, Dip K.
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Sawant, Sandesh Y.
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Kim, Deok Hyun
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Cheon, Taehoon
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Cho, Moo Hwan
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Harada, Ryosuke
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Shigetomi, Toshiyuki
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Suzuki, Kazuharu
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et al
- 2021-02
- Ramesh, Rahul. (2021-02). Ultralow Loading (Single-Atom and Clusters) of the Pt Catalyst by Atomic Layer Deposition Using Dimethyl ((3,4-eta) N,N-dimethyl-3-butene-1-amine-N) Platinum (DDAP) on the High-Surface-Area Substrate for Hydrogen Evolution Reaction. Advanced Materials Interfaces, 8(3), 2001508. doi: 10.1002/admi.202001508
- Wiley-VCH Verlag
- View : 477
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