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Showing results 2 to 6 of 6

Issue Date	Title Author(s) Journal	View
2013-03	Clamping Virtual Supply Voltage of Power-Gated Circuits for Active Leakage Reduction and Gate-Oxide Reliability Improvement Sinkar, Abhishek ; Park, Tae Joon ; Kim, Nam Sung IEEE Transactions on Very Large Scale Integration (VLSI) Systems, v.21, no.3, pp.580 - 584, 2013-03	497
2021-03	End-To-End Reliability of Satellite Communication Network Systems Jung, Seunghwa ; Choi, Jihwan P. IEEE Systems Journal, v.15, no.1, pp.791 - 801, 2021-03	507
2017-10	FineDedup: A fine-grained deduplication technique for extending lifetime of flash-based SSDs Kim, Taejin ; Kim, Jihong ; Lee, Sungjin Journal of Semiconductor Technology and Science, v.17, no.5, pp.648 - 659, 2017-10	744
2015	IMU-based assessment of knee spasticity to improve reliability of Modified Tardieu Scale in cerebral palsy Choi, Seo Young DGIST, 2015	726
2023-07	NoHammer: Preventing Row Hammer with Last-Level Cache Management Lee, Seunghak ; Kang, Ki-Dong ; Park, Gyeongseo ; Kim, Nam Sung ; Kim, Daehoon IEEE Computer Architecture Letters, v.22, no.2, pp.157 - 160, 2023-07	153

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