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Showing results 1 to 2 of 2
Issue Date
Title
Author(s)
Article
Direct extraction of parasitic source and drain resistances in MOSFETs using saturation current ratio
Park, Ji Won
;
Jeong, Seonghyeon
;
Lee, Hanbin
;
Park, So-Jeong
;
Im, Jeong Yeon
;
Kim, Daehwan
;
Lee, Yoonjung
;
Kim, Dong Myong
;
Choi, Sung-Jin
2025-11
Solid-State Electronics, v.229
Elsevier
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Article
Effect of hafnium addition on the electrical properties of indium zinc oxide thin film transistors
Son, Dae-Ho
;
Kim, Dae-Hwan
;
Kim, Jung-Hye
;
Sung, Shi-Joon
;
Jung, Eun-Ae
;
Kang, Jin-Kyu
2011-08
Son, Dae-Ho. (2011-08). Effect of hafnium addition on the electrical properties of indium zinc oxide thin film transistors. Thin Solid Films, 519(20), 6815–6819. doi: 10.1016/j.tsf.2011.04.079
Elsevier
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1