Browsing by Titles

All A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

Showing results 1 to 5 of 5

Article
Al(In)N/GaN Fin-Type HEMT With Very-Low Leakage Current and Enhanced I-V Characteristic for Switching Applications
  • Seo, Jae Hwa ; 
  • Jo, Young-Woo ; 
  • Yoon, Young Jun ; 
  • Son, Dong-Hyeok ; 
  • Won, Chul-Ho ; 
  • Jang, Hwan Soo ; 
  • Kang, In Man ; 
  • Lee, Jung-Hee
  • 2016-07
  • IEEE Electron Device Letters, v.37, no.7, pp.855 - 858
  • Institute of Electrical and Electronics Engineers Inc.
  • View : 939
  • Download : 0
Article
Detection of mutant p53 using field-effect transistor biosensor
  • Han, Sang Hee ; 
  • Kim, Sang Kyu ; 
  • Park, Kyoungsook ; 
  • Yi, So Yeon ; 
  • Park, Hye-Jung ; 
  • Lyu, Hong-Kun ; 
  • Kim, Moonil ; 
  • Chung, Bong Hyun
  • 2010-04-14
  • Han, Sang Hee. (2010-04-14). Detection of mutant p53 using field-effect transistor biosensor. Analytica Chimica Acta, 665(1), 79–83. doi: 10.1016/j.aca.2010.03.006
  • Elsevier B.V.
  • View : 431
  • Download : 0
Article
Detection of mutant p53 using field-effect transistor biosensor
  • Han, Sang Hee ; 
  • Kim, Sang Kyu ; 
  • Park, Kyoungsook ; 
  • Yi, So Yeon ; 
  • Park, Hye-Jung ; 
  • Lyu, Hong-Kun ; 
  • Kim, Moonil ; 
  • Chung, Bong Hyun
  • 2010-04-14
  • Han, Sang Hee. (2010-04-14). Detection of mutant p53 using field-effect transistor biosensor. Analytica Chimica Acta, 665(1), 79–83. doi: 10.1016/j.aca.2010.03.006
  • Elsevier B.V.
  • View : 990
  • Download : 0
Article
Direct extraction of parasitic source and drain resistances in MOSFETs using saturation current ratio
  • Park, Ji Won ; 
  • Jeong, Seonghyeon ; 
  • Lee, Hanbin ; 
  • Park, So-Jeong ; 
  • Im, Jeong Yeon ; 
  • Kim, Daehwan ; 
  • Lee, Yoonjung ; 
  • Kim, Dong Myong ; 
  • Choi, Sung-Jin
  • 2025-11
  • Solid-State Electronics, v.229
  • Elsevier
  • View : 46
  • Download : 0

Gate voltage and drain current stress instabilities in amorphous In-Ga-Zn-O thin-film transistors with an asymmetric graphene electrode

Article
Gate voltage and drain current stress instabilities in amorphous In-Ga-Zn-O thin-film transistors with an asymmetric graphene electrode
  • Kim, Joonwoo ; 
  • Myung, Sung ; 
  • Noh, Hee-Yeon ; 
  • Jeong, Soon Moon ; 
  • Jeong, Jaewook
  • 2015-09
  • AIP Advances, v.5, no.9
  • American Institute of Physics Publishing
  • View : 1033
  • Download : 78
1