Browsing by Titles

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  • Ghafoor, Faisal
  • Kim, Honggyun
  • Ghafoor, Bilal
  • Hamayun, Muhammad Asif
  • Maqsood, Muhammad Faheem
  • Lee, Myoung-Jae
  • Kim, Deok-kee
  • 2025-12
  • Applied Materials Today, v.47
  • Elsevier
  • View : 18
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Reliable Multivalued Conductance States in TaOx Memristors through Oxygen Plasma-Assisted Electrode Deposition with in Situ-Biased Conductance State Transmission Electron Microscopy Analysis

  • 2018-09
  • Lee, Myoung-Jae. (2018-09). Reliable Multivalued Conductance States in TaOx Memristors through Oxygen Plasma-Assisted Electrode Deposition with in Situ-Biased Conductance State Transmission Electron Microscopy Analysis. ACS Applied Materials & Interfaces, 10(35), 29757–29765. doi: 10.1021/acsami.8b09046
  • American Chemical Society
  • View : 1018
  • Download : 42
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