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Issue Date	Title Author(s) Journal	View
2018-09	Reliable Multivalued Conductance States in TaOx Memristors through Oxygen Plasma-Assisted Electrode Deposition with in Situ-Biased Conductance State Transmission Electron Microscopy Analysis Lee, Myoung-Jae ; Park, Gyeong-Su ; Seo, David Hyungseok ; Kwon, Sung Min ; Lee, Hyeon-Jun ; Kim, June-Seo ; Jung, Minkyung ; You, Chun-Yeol ; Lee, Hyangsook ; Kim, Hee-Goo ; et al ACS Applied Materials & Interfaces, v.10, no.35, pp.29757 - 29765, 2018-09	737

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