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Electron-blocking by the potential barrier originated from the asymmetrical local density of state in the oxide semiconductor

Article
Electron-blocking by the potential barrier originated from the asymmetrical local density of state in the oxide semiconductor
  • 2017-12
  • Lee, Hyeon-Jun. (2017-12). Electron-blocking by the potential barrier originated from the asymmetrical local density of state in the oxide semiconductor. doi: 10.1038/s41598-017-18420-9
  • Nature Publishing Group
  • View : 879
  • Download : 125

Impact of transient currents caused by alternating drain stress in oxide semiconductors

Article
Impact of transient currents caused by alternating drain stress in oxide semiconductors
  • 2017-08
  • Lee, Hyeon-Jun. (2017-08). Impact of transient currents caused by alternating drain stress in oxide semiconductors. Scientific Reports, 7(1), 9782–9790. doi: 10.1038/s41598-017-10285-2
  • Nature Publishing Group
  • View : 884
  • Download : 127
Article
Stress Release Effect of Micro-hole Arrays for Flexible Electrodes and Thin Film Transistors
  • Lee, Gwang Jun ; 
  • Heo, Su Jin ; 
  • Lee, Seungchul ; 
  • Yang, Jae Hoon ; 
  • Jun, Byoung Ok ; 
  • Kim, Hyun Sik ; 
  • Jang, Jae Eun
  • 2020-04
  • Lee, Gwang Jun. (2020-04). Stress Release Effect of Micro-hole Arrays for Flexible Electrodes and Thin Film Transistors. ACS Applied Materials & Interfaces, 12(16), 19226–19234. doi: 10.1021/acsami.0c02362
  • American Chemical Society
  • View : 762
  • Download : 0
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