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- Lee, Hyeon-Jun ;
- Abe, Katsumi
- 2020-06
- Lee, Hyeon-Jun. (2020-06). A Study on the Effect of Pulse Rising and Falling Time on Amorphous Oxide Semiconductor Transistors in Driver Circuits. IEEE Electron Device Letters, 41(6), 896–899. doi: 10.1109/led.2020.2986478
- Institute of Electrical and Electronics Engineers
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