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  • Lee, Jaewon ; 
  • Francese, Pier-Andrea ; 
  • Braendli, Matthias ; 
  • Morf, Thomas ; 
  • Kossel, Marcel ; 
  • Jang, Seoyoung ; 
  • Choi, Yujin ; 
  • Kim, Donggeon ; 
  • Jang, Taekwang ; 
  • Kim, Gain
  • 2026-01
  • IEEE Journal of Solid-State Circuits, v.61, no.1, pp.8 - 19
  • Institute of Electrical and Electronics Engineers
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  • Lee, Jaewon ; 
  • Jang, Seoyoung ; 
  • Choi, Yujin ; 
  • Kim, Donggeon ; 
  • Braendli, Matthias ; 
  • Morf, Thomas ; 
  • Kossel, Marcel ; 
  • Francese, Pier-Andrea ; 
  • Kim, Gain
  • 2025-06
  • Lee, Jaewon. (2025-06). A 2-Lane DAC-/ADC-Based 2 × 2 MIMO PAM-4 MMSE-DFE Wireline Transceiver With FEXT Cancellation on RFSoC Platform. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 33(6), 1570–1581. doi: 10.1109/TVLSI.2025.3553400
  • Institute of Electrical and Electronics Engineers
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  • Jang, Seoyoung ; 
  • Kossel, Marcel ; 
  • Lee, Jaewon ; 
  • Brandli, Matthias ; 
  • Morf, Thomas ; 
  • Choi, Yujin ; 
  • Kim, Donggeon ; 
  • Kang, Gayoung ; 
  • Choi, Yoonji ; 
  • Francese, Pier-Andrea ; 
  • et al
  • 2026-07
  • IEEE JOURNAL OF SOLID-STATE CIRCUITS, v.61, no.7, pp.3142 - 3153
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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  • Kim, Donggeon ; 
  • Choi, Yujin ; 
  • Lee, Jaewon ; 
  • Jang, Seoyoung ; 
  • Song, Sungyu ; 
  • Braendli, Matthias ; 
  • Morf, Thomas ; 
  • Kossel, Marcel ; 
  • Francese, Pier-Andrea ; 
  • Kim, Gain
  • 2024-11
  • Kim, Donggeon. (2024-11). A Loop-Break Decision Feedback Equalizer for DAC/ADC-DSP-Based Wireline Transceivers. IEEE Transactions on Circuits and Systems I: Regular Papers, 71(11), 5115–5128. doi: 10.1109/TCSI.2024.3435696
  • Institute of Electrical and Electronics Engineers
  • View : 661
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Recent Advances in Ultra-High-Speed Wireline Receivers with ADC-DSP-Based Equalizers

  • Jang, Seoyoung ; 
  • Lee, Jaewon ; 
  • Choi, Yujin ; 
  • Kim, Donggeon ; 
  • Kim, Gain
  • 2024-11
  • Jang, Seoyoung. (2024-11). Recent Advances in Ultra-High-Speed Wireline Receivers with ADC-DSP-Based Equalizers. IEEE Open Journal of the Solid-State Circuits Society, 4, 290–304. doi: 10.1109/OJSSCS.2024.3506692
  • Institute of Electrical and Electronics Engineers
  • View : 12284
  • Download : 4011
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