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Issue Date	Title Author(s) Journal	View
2013-09-07	Analysis of temperature-dependent electrical characteristics in amorphous In-Ga-Zn-Othin-film transistors using gated-four-probe measurements Jeong, Jaewook ; Lee, Gwang Jun ; Kim, Joonwoo ; Jeong, Soon Moon ; Kim, Jung-Hye Journal of Applied Physics, v.114, no.9, 2013-09-07	571

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