DGIST Scholar: Search

DGIST Scholar

Results 1-1 of 1 (Search time: 0.001 seconds).

Issue Date	Title Author(s) Journal	View
2015-09	Gate voltage and drain current stress instabilities in amorphous In-Ga-Zn-O thin-film transistors with an asymmetric graphene electrode Kim, Joonwoo ; Myung, Sung ; Noh, Hee-Yeon ; Jeong, Soon Moon ; Jeong, Jaewook AIP Advances, v.5, no.9, 2015-09	656

DGIST

DGIST Scholar was built with support from the OAK distribution project by the National Library of Korea.

You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.

Library Services Team, DGIST 333. Techno Jungang-daero, Hyeonpung-myeon, Dalseong-gun, Daegu, 42988, Republic of Korea.

RSS_1.0 RSS_2.0 ATOM_1.0