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Issue Date	Title Author(s) Journal	View
2012-06-13	Measuring Open Innovation by patents Objectively and Applying it to Analyze IT Convergence Industry Yun, Jinhyo Joseph ; Avvari, Mohan V. ; Jung, Wooyoung ; Jeong, Eui Seob 7th International Forum on Knowledge Asset Dynamics (IFKAD) / 5th Knowledge Cities World Summit (KCWS), pp.2087 - 2107, 2012-06-13	31

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