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Issue Date	Title Author(s) Journal	View
2013-03	Clamping Virtual Supply Voltage of Power-Gated Circuits for Active Leakage Reduction and Gate-Oxide Reliability Improvement Sinkar, Abhishek ; Park, Tae Joon ; Kim, Nam Sung IEEE Transactions on Very Large Scale Integration (VLSI) Systems, v.21, no.3, pp.580 - 584, 2013-03	497

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