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Issue Date	Title Author(s) Journal	View
2020-07-08	Deep Learning-Based Apple Defect Detection with Residual SqueezeNet Alam, M. D. Nur ; Ullah, Ihsan ; Al-Absi, Ahmed Abdulhakim International Conference on Smart Computing and Cyber Security: Strategic Foresight, Security Challenges and Innovation, SMARTCYBER 2020, pp.127 - 134, 2020-07-08	625

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