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Laser-induced digital oxidation for copper-based flexible photodetectors
- Laser-induced digital oxidation for copper-based flexible photodetectors
- Kwon, Hyeokjin; Kim, Junil; Ko, Kyungmin; Matthews, Manyalibo J.; Suh, Joonki; Kwon, Hyuk-Jun; Yoo, Jae-Hyuck
- DGIST Authors
- Kwon, Hyuk-Jun
- Issue Date
- Applied Surface Science, 540(2), 148333
- Article Type
- Author Keywords
- Laser; Copper; Oxidation; Flexible electronics; Photodetectors
- Metallic films; Oxide minerals; Photocurrents; Photodetectors; Photoelectron spectroscopy; Photons; Scanning electron microscopy; Semiconductor lasers; Substrates; Thermooxidation; Flexible photodetectors; Flexible substrate; Laser-induced oxidation; Metal semiconductor metal photodetector; Scanning photocurrent microscopies; Semiconducting materials; Transport behavior; X ray photoemission spectroscopy; Copper oxides
- Copper oxide compounds (CuxO) with bandgaps of 1.3–2.1 eV (CuO) and 2.1–2.6 eV (Cu2O) have been investigated as promising p-type semiconducting materials. CuxO is generally obtained by deposition or thermal oxidation, but those methods are not optimal for flexible substrates. Furthermore, additional patterning steps are required to fabricate devices. We present an easy, controllable method to fabricate a metal-semiconductor-metal (MSM) photodetector using laser-induced oxidation of a thin Cu film. After laser irradiation, the Cu film is heated under ambient conditions, and this leads to a thermal oxidation reaction, in which Cu oxide is monolithically formed in the Cu film and a Cu-CuxO-Cu MSM structure is produced. Since the laser offers localized heating, an arbitrary CuxO pattern can be written in the Cu film by spatially controlled heating. In addition, by optimizing the heating time, the laser-induced oxidation can be successfully performed even on a flexible substrate. To study the laser-induced oxidation, we examined the correlation between laser parameters and the oxidation pattern and analyzed the composition using scanning electron microscopy, Raman spectroscopy, and X-ray photoemission spectroscopy. Furthermore, we measured the transient photoresponse and employed scanning photocurrent microscopy to investigate the mechanism of carrier transport behavior. © 2020
- Elsevier B.V.
- Related Researcher
Advanced Electronic Devices Research Group(AEDRG) - Kwon Lab.
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- Department of Information and Communication EngineeringAdvanced Electronic Devices Research Group(AEDRG) - Kwon Lab.1. Journal Articles
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