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DC Field Value Language
dc.contributor.author Lee, Hyeon-Jun ko
dc.contributor.author Abe, Katsumi ko
dc.date.accessioned 2021-08-26T05:47:11Z -
dc.date.available 2021-08-26T05:47:11Z -
dc.date.created 2020-01-13 -
dc.date.issued 2019-09-18 -
dc.identifier.citation 2019 E-MRS Fall Meeting and Exhibit -
dc.identifier.uri http://hdl.handle.net/20.500.11750/14308 -
dc.language English -
dc.publisher European Materials Research Society -
dc.title A study for the impact ionization in the oxide semiconductor system -
dc.type Conference -
dc.type.local Article(Overseas) -
dc.type.rims CONF -
dc.description.journalClass 1 -
dc.contributor.localauthor Lee, Hyeon-Jun -
dc.contributor.nonIdAuthor Abe, Katsumi -
dc.identifier.citationTitle 2019 E-MRS Fall Meeting and Exhibit -
dc.identifier.conferencecountry PL -
dc.identifier.conferencelocation Warsaw -


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