DGIST Scholar: Ion imaging improvement of cells by graphene capping technique in time-of-flight secondary ion mass Spectrometry

DGIST ScholarDepartment of Robotics and Mechatronics Engineering Robotics Engineering Research Center 2. Conference Papers

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Ion imaging improvement of cells by graphene capping technique in time-of-flight secondary ion mass Spectrometry

Title: Ion imaging improvement of cells by graphene capping technique in time-of-flight secondary ion mass Spectrometry

Authors: Lim, Heejin; Lee, SunYoung; Kim, Jae Young; Moon, DaeWon

DGIST Authors: Kim, Jae Young

Issue Date: 2019-06-24

Citation: 2019 International Forum on Functional Materials (IFFM 2019)

Type: Conference

URI: http://hdl.handle.net/20.500.11750/14410

Publisher: Korean Vacuum Society

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Collection:: Department of Robotics and Mechatronics Engineering Robotics Engineering Research Center 2. Conference Papers

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