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Method for evaluating interfacial resistances of thermoelectric device using I-V measurement

Title
Method for evaluating interfacial resistances of thermoelectric device using I-V measurement
Authors
Kim, Dong HwanKim, ChamKim, Jong TaeYoon, Duck KiKim, Hoyoung
DGIST Authors
Kim, Dong HwanKim, Cham; Kim, Jong Tae; Kim, Hoyoung
Issue Date
2018-04-26
Citation
2018년도 대한금속·재료학회 춘계학술대회
Type
Conference
URI
http://hdl.handle.net/20.500.11750/15025
Publisher
대한금속·재료학회
Related Researcher
Files:
There are no files associated with this item.
Collection:
Division of Nanotechnology2. Conference Papers


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