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Reliable and Uniform Thin-Film Transistor Arrays Based on Inkjet-Printed Polymer Semiconductors for Full Color Reflective Displays

Title
Reliable and Uniform Thin-Film Transistor Arrays Based on Inkjet-Printed Polymer Semiconductors for Full Color Reflective Displays
Author(s)
Lee, J[Lee, Jiyoul]Kim, DH[Kim, Do Hwan]Kim, JY[Kim, Joo-Young]Yoo, B[Yoo, Byungwook]Chung, JW[Chung, Jong Won]Park, JI[Park, Jeong-Il]Lee, BL[Lee, Bang-Lin]Jung, JY[Jung, Ji Young]Park, JS[Park, Joon Seok]Koo, B[Koo, Bonwon]Im, S[Im, Seongil]Kim, JW[Kim, Jung Woo]Song, B[Song, Byungkwon]Jung, MH[Jung, Myung-Hoon]Jang, JE[Jang, Jae Eun]Jin, YW[Jin, Yong Wan]Lee, SY[Lee, Sang-Yoon]
DGIST Authors
Jang, JE[Jang, Jae Eun]
Issued Date
2013-11
Type
Article
Article Type
Article
Subject
Channel InterfaceConjugated CopolymersConjugated PolymersConvergence of Numerical MethodsDensity of Trap StateDisplay DevicesFlexible DisplayFlexible DisplaysFull-Color DisplaysInkjet-PrintingInterface StatesOrganic Field-Effect TransistorsPolymer SemiconductorPolymer SemiconductorsPolymer TransistorsPolymersReflective DisplaySemiconductor DevicesStabilityThin-Film Transistor (TFT)Thin-Film Transistors (TFTs)
ISSN
0935-9648
Abstract
Stable uniform performance inkjet-printed polymer transistor arrays, which allow demonstration of flexible full-color displays, were achieved by new ambient processable conjugated copolymer semiconductor, and OTFT devices incorporating this material showed high mobility values > 1.0 cm2 V-1s-1. Bias-stress stability of the devices was improved with a channel-passivation layer, which suppresses the density of trap states at the channel interface. © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
URI
http://hdl.handle.net/20.500.11750/1693
DOI
10.1002/adma.201301257
Publisher
Wiley-VCH Verlag
Related Researcher
  • 장재은 Jang, Jae Eun 전기전자컴퓨터공학과
  • Research Interests Nanoelectroinc device; 생체 신호 센싱 시스템 및 생체 모방 디바이스; 나노 통신 디바이스
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Appears in Collections:
Department of Electrical Engineering and Computer Science Advanced Electronic Devices Research Group(AEDRG) - Jang Lab. 1. Journal Articles

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