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dc.contributor.author Kim, Ji Hoon ko
dc.contributor.author Kang, Byoung Chae ko
dc.contributor.author Choi, Bong Yeol ko
dc.contributor.author Lee, Seong Hun ko
dc.contributor.author Kim, Kyung Youn ko
dc.date.available 2017-05-15T07:53:02Z -
dc.date.created 2017-05-08 -
dc.date.issued 2006 -
dc.identifier.citation 2006 5th IEEE Conference on Sensors, pp.923 - 926 -
dc.identifier.isbn 1424403766 -
dc.identifier.uri http://hdl.handle.net/20.500.11750/1915 -
dc.description.abstract In general, image reconstruction algorithms for electrical capacitance tomography (ECT) can be classified into iterative and noniterative algorithms. Iterative algorithms produce better quality images however they can only be used off-line due to intensive computational burden. In the context of computational burden, in this paper we propose a fast noniterative image reconstruction algorithm called on-line directional algebraic reconstruction technique (OLDART) which likes its predecessor, directional algebraic reconstruction technique (DART), produces the same quality image but reduces the reconstruction time. The reconstruction procedure of the proposed algorithm comprises of two steps. In the first step, a modified weighting matrix is generated off-line, and in the second step, the matrix is used for on-line image reconstruction in the same manner as the sensitivity matrix in the linear back-projection algorithm is used. In order to assess the reconstruction performance, extensive simulation results are provided for the proposed approach. © 2006 IEEE. -
dc.publisher Internatiuonal Conference on Control, Automation and Systems -
dc.title On-line directional algebraic reconstruction technique for electrical capacitance tomography -
dc.type Conference -
dc.identifier.doi 10.1109/ICSENS.2007.355617 -
dc.identifier.scopusid 2-s2.0-50149090032 -
dc.type.rims CONF -
dc.contributor.nonIdAuthor Kim, Ji Hoon -
dc.contributor.nonIdAuthor Kang, Byoung Chae -
dc.contributor.nonIdAuthor Choi, Bong Yeol -
dc.contributor.nonIdAuthor Kim, Kyung Youn -
dc.identifier.citationStartPage 923 -
dc.identifier.citationEndPage 926 -
dc.identifier.citationTitle 2006 5th IEEE Conference on Sensors -
dc.type.journalArticle Conference Paper -
dc.identifier.conferencecountry US -
dc.identifier.conferencelocation Daegu -
dc.contributor.affiliatedAuthor Lee, Seong Hun -
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