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dc.contributor.author Kim, Bora -
dc.contributor.author Seol, Daehee -
dc.contributor.author Lee, Shinbuhm -
dc.contributor.author Lee, Ho Nyung -
dc.contributor.author Kim, Yunseok -
dc.date.available 2017-07-05T08:34:23Z -
dc.date.created 2017-04-10 -
dc.date.issued 2016-09 -
dc.identifier.issn 0003-6951 -
dc.identifier.uri http://hdl.handle.net/20.500.11750/2201 -
dc.description.abstract Piezoresponse force microscopy (PFM) has provided advanced nanoscale understanding and analysis of ferroelectric and piezoelectric properties. In PFM-based studies, electromechanical strain induced by the converse piezoelectric effect is probed and analyzed as a PFM response. However, electromechanical strain can also arise from several non-piezoelectric origins that may lead to a misinterpretation of the observed response. Among them, electrostatic interaction can significantly affect the PFM response. Nonetheless, previous studies explored solely the influence of electrostatic interaction on the PFM response under the situation accompanied with polarization switching. Here, we show the influence of the electrostatic interaction in the absence of polarization switching by using unipolar voltage sweep. The obtained results reveal that the electromechanical neutralization between piezoresponse of polarization and electrostatic interaction plays a crucial role in the observed ferroelectric-like hysteresis loop despite the absence of polarization switching. Thus, our work can provide a basic guideline for the correct interpretation of the hysteresis loop in PFM-based studies. -
dc.language English -
dc.publisher American Institute of Physics -
dc.title Ferroelectric-like hysteresis loop originated from non-ferroelectric effects -
dc.type Article -
dc.identifier.doi 10.1063/1.4962387 -
dc.identifier.scopusid 2-s2.0-84986292344 -
dc.identifier.bibliographicCitation Applied Physics Letters, v.109, no.10, pp.102901 - 145 -
dc.description.isOpenAccess FALSE -
dc.subject.keywordPlus PIEZORESPONSE FORCE MICROSCOPY -
dc.subject.keywordPlus SCANNING PROBE MICROSCOPY -
dc.subject.keywordPlus PIEZOELECTRICITY -
dc.subject.keywordPlus NANOCAPACITORS -
dc.subject.keywordPlus POLARIZATION -
dc.subject.keywordPlus NANOSCALE -
dc.subject.keywordPlus FILMS -
dc.citation.endPage 145 -
dc.citation.number 10 -
dc.citation.startPage 102901 -
dc.citation.title Applied Physics Letters -
dc.citation.volume 109 -
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Department of Physics and Chemistry Multifunctional films and nanostructures Lab 1. Journal Articles

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