Quantitative Compositional Profiling of Conjugated Quantum Dots with Single Atomic Layer Depth Resolution via Time-of-Flight Medium-Energy Ion Scattering Spectroscopy
Title
Quantitative Compositional Profiling of Conjugated Quantum Dots with Single Atomic Layer Depth Resolution via Time-of-Flight Medium-Energy Ion Scattering Spectroscopy
Research Interests
Coherent Raman Scattering; Surface Plasmon Resonance Imaging Ellipsometry; Imaging Mass Spectrometry; Time-of-flight Medium Energy Ion Scattering