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Issue Date	Title Author(s) Journal	View
2014-01-21	Quantitative Compositional Profiling of Conjugated Quantum Dots with Single Atomic Layer Depth Resolution via Time-of-Flight Medium-Energy Ion Scattering Spectroscopy Jung, Kang-Won ; Yu, Hyunung ; Min, Won Ja ; Yu, Kyu-Sang ; Sortica, M. A. ; Grande, Pedro L. ; Moon, DaeWon Analytical Chemistry, v.86, no.2, pp.1091 - 1097, 2014-01-21	731
2014-11	Investigation of Cs surface layer formation in Cs-SIMS with TOF-MEIS and SIMS Houssiau, L. ; Noel, C. ; Mine, N. ; Jung, K. W. ; Min, W. J. ; Moon, D. W. Wiley Blackwell, 2014-11	892
2018-09	Quantitative Analysis of Calcium Phosphate Nanocluster Growth Using Time-of-Flight Medium-Energy-Ion-Scattering Spectroscopy Park, Jimin ; Yang, Ki Dong ; Kim, Na-Young ; Jung, Kang-Won ; Le, Viet-Duc ; Lim, Hee-Jin ; An, Junghyun ; Jin, Kyoungsuk ; Kim, Yong-Hyun ; Nam, Ki Tae ; et al American Chemical Society, 2018-09	580

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