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Development of a high performance MEA using Current-sensing Atomic Force Microscopy (CS-AFM) and (Nano-scale impedance spectroscopy (NIS)
- Development of a high performance MEA using Current-sensing Atomic Force Microscopy (CS-AFM) and (Nano-scale impedance spectroscopy (NIS)
- Kwon, O Sung; Lee, Sang Cheol; Lee, Dong Ha; Han, Byungchan; Hwang, Sun-Wook; Choi, Gyeungho; Mukherjee, Santanu; Bates, Alex Bates; Park, Sam
- DGIST Authors
- Kwon, O Sung; Lee, Sang Cheol; Lee, Dong Ha; Han, Byungchan; Hwang, Sun-Wook; Choi, Gyeungho
- Issue Date
- 12th Polymer Electrolyte Fuel Cell Symposium, PEFC 2012 - 222nd ECS Meeting, 50(2), 853-858
- Article Type
- Conference Paper
- Current-sensing Atomic Force Microscopy (CS-AFM) and Nano-scale Impedance Spectroscopy (NIS) are key characterization tools in the research and development of diverse materials systems. These have been used in fuel cell research to distinguish between various sources of cell losses; for example, ohmic losses in the electrodes and electrolytes, activation over-potentials due to reaction kinetics, and mass transport effects. Proton transport and water diffusion phenomena are locally observed to determine the ionic channel structure and mechanism. © The Electrochemical Society.
- Electrochemical and Solid-State
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