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A Top-Down Strategy for Reforming the Characteristics of NiO Hole Transport Layer in Inverted Perovskite Solar Cells
- Division of Energy & Environmental Technology
- 1. Journal Articles
- Division of Energy & Environmental Technology
- Next-Generation Solar Energy Harvesting Laboratory
- 1. Journal Articles
- Department of Energy Science and Engineering
- Chemical & Energy Materials Engineering (CEME) Laboratory
- 1. Journal Articles
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- Title
- A Top-Down Strategy for Reforming the Characteristics of NiO Hole Transport Layer in Inverted Perovskite Solar Cells
- Issued Date
- 2023-06
- Citation
- Ko, Seonkyung. (2023-06). A Top-Down Strategy for Reforming the Characteristics of NiO Hole Transport Layer in Inverted Perovskite Solar Cells. Solar RRL, 7(11). doi: 10.1002/solr.202300049
- Type
- Article
- Author Keywords
- hole transport layers ; anodization ; nanostructures ; NiO ; perovskite solar cells
- Keywords
- PLANAR-STRUCTURE ; EFFICIENT ; TEMPERATURE ; HYSTERESIS ; LENGTHS
- ISSN
- 2367-198X
- Abstract
-
The hole transport layer (HTL) plays a key role in inverted perovskite solar cells (PSCs), and nickel oxide has been widely adopted for HTL. However, a conventional solution-processed bottom-up approach for NiOx (S-NiO) HTL fabrication shows several drawbacks, such as poor coverage, irregular film thickness, numerous defect sites, and inefficient hole extraction from the perovskite layer. To address these issues, herein, a novel NiOx HTL top-down synthesis route via electrochemical anodization is developed. The basicity of the electrolyte used in anodization considerably influences electrochemical reactions and results in the structure of the anodized NiOx (A-NiO). The optimized A-NiO provides outstanding optoelectrical properties, including uniform film thickness, enhanced transmittance, deep-lying valance band, low trap density, and better hole extraction ability from the perovskite. Owing to these advantages, the A-NiO-based inverted PSC exhibits an improved power conversion efficiency of 21.9% compared with 19.1% for the S-NiO-based device. In addition, the A-NiO device shows a higher inlet and long-term ambient stability than the S-NiO device due to the superior hole transfer ability of A-NiO, which suppresses charge accumulation between NiOx and the perovskite interface. © 2023 Wiley-VCH GmbH.
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- Publisher
- Wiley
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