Department of Electrical Engineering and Computer Science
Integrated Nano-Systems Laboratory
2. Conference Papers
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Baik, Seungyeob | - |
| dc.contributor.author | Seol, Tae Ryoung | - |
| dc.contributor.author | Lee, Sehwan | - |
| dc.contributor.author | Kim, Geunha | - |
| dc.contributor.author | Cho, SeongHwan | - |
| dc.contributor.author | George, Arup Kocheethra | - |
| dc.contributor.author | Lee, Junghyup | - |
| dc.date.accessioned | 2023-12-26T18:13:25Z | - |
| dc.date.available | 2023-12-26T18:13:25Z | - |
| dc.date.created | 2022-08-16 | - |
| dc.date.issued | 2022-06-15 | - |
| dc.identifier.isbn | 9781665497725 | - |
| dc.identifier.issn | 2158-9682 | - |
| dc.identifier.uri | http://hdl.handle.net/20.500.11750/46838 | - |
| dc.description.abstract | In this paper, we propose a time-locked ?S CDC (TL?S CDC) that achieves the state-of-the-art FOMS=2.54Jppm2, supply sensitivity of ±0.55%/V over 1.2-2.2V and temperature sensitivity of 49.1ppm/°C over -20°C and 125°C. The sensing resolution is 70.5aF. Implemented in a 0.18m standard CMOS process, the TL?S CDC consumes 42.76W from a 1.2V supply and 0.2mm2 active area. © 2022 IEEE. | - |
| dc.language | English | - |
| dc.publisher | IEEE Electron Devices Society, IEEE Solid-State Circuits Society, Japan Society of Applied Physics | - |
| dc.title | A 2.54μJ∙ppm2-FOMS Supply- and Temperature-Independent Time-Locked ΔΣ Capacitance-to-Digital Converter in 0.18-μm CMOS | - |
| dc.type | Conference Paper | - |
| dc.identifier.doi | 10.1109/VLSITechnologyandCir46769.2022.9830524 | - |
| dc.identifier.scopusid | 2-s2.0-85135223114 | - |
| dc.identifier.bibliographicCitation | IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), pp.114 - 115 | - |
| dc.identifier.url | https://archive.vlsisymposium.org/22web/program/schedule-at-a-glance/ | - |
| dc.citation.conferencePlace | US | - |
| dc.citation.conferencePlace | Honolulu | - |
| dc.citation.endPage | 115 | - |
| dc.citation.startPage | 114 | - |
| dc.citation.title | IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022) | - |
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