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Effects of Mo back-contact annealing on surface potential and carrier transport in Cu2ZnSnS4 thin film solar cells

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Title
Effects of Mo back-contact annealing on surface potential and carrier transport in Cu2ZnSnS4 thin film solar cells
Issued Date
2016
Citation
Kim, Juran. (2016). Effects of Mo back-contact annealing on surface potential and carrier transport in Cu2ZnSnS4 thin film solar cells. RSC Advances, 6(105), 103337–103345. doi: 10.1039/c6ra22563b
Type
Article
Keywords
Atomic Force Microscopy ; Conductive Atomic Force Microscopy ; Conversion Efficiency ; Cu(In, Ga)Se-2 ; CZTS Thin Films ; Electron-Hole Recombination ; ENHANCemENT ; GRAIN-BOUNDARIES ; Grain Boundaries ; GROWTH ; Kelvin Probe Force Microscopy ; Minority-Carrier Collection ; Nitrogen Atmospheres ; Open Circuit Voltage ; PERFORMANCE ; ROUTES ; SECONDARY PHASES ; Soda Lime Glass ; Sodium ; Solar Cells ; Surface Potential ; Thin Film Solar Cells ; Thin Films ; Absorber Layers ; Annealing ; Annealing Temperatures ; Atmospheric Temperature
ISSN
2046-2069
Abstract

The effects of Na on Cu2ZnSnS4 (CZTS)-based solar cells have been examined with respect to surface potential and carrier transport. The Mo back-contact was annealed in a furnace for 10 minutes under a nitrogen atmosphere at different temperatures and CZTS thin films were subsequently grown by sputtering and sulfurization. The thickness of MoS2, formed during the sulfurization process, decreased as the Mo annealing temperature increased. Interestingly, the Na contents diffused from soda lime glass has increased as well. The current and surface potential near CZTS grain boundaries were investigated by Kelvin probe force microscopy (KPFM) and conductive atomic force microscopy (C-AFM) were used. Surface current increased with increasing annealing temperature and surface potential increased up to approximately 50 mV near GBs, which led to inhibition of electron-hole recombination and an increase in minority carrier collection near GBs. This observation explains the improvement of solar cell open circuit voltage (VOC) and current density (JSC). © 2016 The Royal Society of Chemistry.

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URI
http://hdl.handle.net/20.500.11750/5144
DOI
10.1039/c6ra22563b
Publisher
Royal Society of Chemistry
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양기정
Yang, Kee-Jeong양기정

Division of Energy & Environmental Technology

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