Detail View

Electrode Placement Optimization for Electrical Impedance Tomography Using Active Learning
Citations

WEB OF SCIENCE

Citations

SCOPUS

Metadata Downloads

DC Field Value Language
dc.contributor.author Lee, Junhyeong -
dc.contributor.author Park, Kyungseo -
dc.contributor.author Park, Kundo -
dc.contributor.author Kim, Yongtae -
dc.contributor.author Kim, Jung -
dc.contributor.author Ryu, Seunghwa -
dc.date.accessioned 2024-10-08T09:10:13Z -
dc.date.available 2024-10-08T09:10:13Z -
dc.date.created 2024-05-02 -
dc.date.issued 2024-06 -
dc.identifier.issn 1438-1656 -
dc.identifier.uri http://hdl.handle.net/20.500.11750/56941 -
dc.description.abstract Electrical impedance tomography (EIT) offers a versatile imaging modality with a multitude of applications, although it encounters accuracy limitations. Herein, a novel systematic framework is presented that integrates a neural network (NN), active learning, and transfer learning to optimize electrode placement, improving image reconstruction performance based on user-defined metrics. Given the many-to-one mapping between electrode configuration and the performance metric, the approach utilizes a NN that predicts performance metrics from electrode placement input. To maintain NN's prediction accuracy for unseen electrode configurations, performance metrics are maximized while iteratively updating the NN via active learning during the optimization process. Transfer learning is employed to expedite optimization of electrode placements for time-consuming iterative reconstruction techniques by fine-tuning a NN initially trained on one-step reconstruction data. The method is validated using two representative reconstruction methods: one-step reconstruction with Newton's one-step error reconstructor prior and the iterative total variation method. This research underscores the potential of the proposed framework in addressing EIT's inherent limitations and augmenting its performance across diverse applications and reconstruction methods. The framework could potentially contribute to the advancement of noninvasive medical imaging, structural health monitoring, strain sensing, robotics, and other fields that depend on EIT. © 2024 The Authors. Advanced Engineering Materials published by Wiley-VCH GmbH. -
dc.language English -
dc.publisher Wiley -
dc.title Electrode Placement Optimization for Electrical Impedance Tomography Using Active Learning -
dc.type Article -
dc.identifier.doi 10.1002/adem.202301865 -
dc.identifier.wosid 001208309100001 -
dc.identifier.scopusid 2-s2.0-85191177750 -
dc.identifier.bibliographicCitation Lee, Junhyeong. (2024-06). Electrode Placement Optimization for Electrical Impedance Tomography Using Active Learning. Advanced Engineering Materials, 26(11). doi: 10.1002/adem.202301865 -
dc.description.isOpenAccess TRUE -
dc.subject.keywordAuthor data-driven optimization -
dc.subject.keywordAuthor electrical impedance tomography -
dc.subject.keywordAuthor machine learning -
dc.subject.keywordPlus DAMAGE DETECTION -
dc.subject.keywordPlus DRIVE PATTERN -
dc.subject.keywordPlus RECONSTRUCTION -
dc.subject.keywordPlus DESIGN -
dc.subject.keywordPlus SIZE -
dc.citation.number 11 -
dc.citation.title Advanced Engineering Materials -
dc.citation.volume 26 -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.relation.journalResearchArea Materials Science -
dc.relation.journalWebOfScienceCategory Materials Science, Multidisciplinary -
dc.type.docType Article -
Show Simple Item Record

File Downloads

공유

qrcode
공유하기

Related Researcher

박경서
Park, Kyungseo박경서

Department of Robotics and Mechatronics Engineering

read more

Total Views & Downloads