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Temporal-Quality Ensemble Technique for Handling Image Blur in Packaging Defect Inspection
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dc.contributor.author Son, Guk-Jin -
dc.contributor.author Jung, Hee-Chul -
dc.contributor.author Kim, Young-Duk -
dc.date.accessioned 2024-10-08T13:40:19Z -
dc.date.available 2024-10-08T13:40:19Z -
dc.date.created 2024-08-08 -
dc.date.issued 2024-07 -
dc.identifier.issn 1424-8220 -
dc.identifier.uri http://hdl.handle.net/20.500.11750/56962 -
dc.description.abstract Despite achieving numerous successes with surface defect inspection based on deep learning, the industry still faces challenges in conducting packaging defect inspections that include critical information such as ingredient lists. In particular, while previous achievements primarily focus on defect inspection in high-quality images, they do not consider defect inspection in low-quality images such as those containing image blur. To address this issue, we proposed a noble inference technique named temporal-quality ensemble (TQE), which combines temporal and quality weights. Temporal weighting assigns weights to input images by considering the timing in relation to the observed image. Quality weight prioritizes high-quality images to ensure the inference process emphasizes clear and reliable input images. These two weights improve both the accuracy and reliability of the inference process of low-quality images. In addition, to experimentally evaluate the general applicability of TQE, we adopt widely used convolutional neural networks (CNNs) such as ResNet-34, EfficientNet, ECAEfficientNet, GoogLeNet, and ShuffleNetV2 as the backbone network. In conclusion, considering cases where at least one low-quality image is included, TQE has an F1-score approximately 17.64% to 22.41% higher than using single CNN models and about 1.86% to 2.06% higher than an average voting ensemble. © 2024 by the authors. -
dc.language English -
dc.publisher MDPI -
dc.title Temporal-Quality Ensemble Technique for Handling Image Blur in Packaging Defect Inspection -
dc.type Article -
dc.identifier.doi 10.3390/s24144438 -
dc.identifier.wosid 001277216200001 -
dc.identifier.scopusid 2-s2.0-85199796098 -
dc.identifier.bibliographicCitation Son, Guk-Jin. (2024-07). Temporal-Quality Ensemble Technique for Handling Image Blur in Packaging Defect Inspection. Sensors, 24(14). doi: 10.3390/s24144438 -
dc.description.isOpenAccess TRUE -
dc.subject.keywordAuthor packaging -
dc.subject.keywordAuthor defect inspection -
dc.subject.keywordAuthor temporal-quality analysis -
dc.subject.keywordAuthor deep learning -
dc.subject.keywordAuthor image blur -
dc.subject.keywordAuthor ensemble -
dc.citation.number 14 -
dc.citation.title Sensors -
dc.citation.volume 24 -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.relation.journalResearchArea Chemistry; Engineering; Instruments & Instrumentation -
dc.relation.journalWebOfScienceCategory Chemistry, Analytical; Engineering, Electrical & Electronic; Instruments & Instrumentation -
dc.type.docType Article -
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Kim, Youngduk김영덕

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