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A PVT-Insensitive Sub-Ranging Current Reference Achieving 11.4-ppm° C From-20° C to 125 ° C
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- Title
- A PVT-Insensitive Sub-Ranging Current Reference Achieving 11.4-ppm° C From-20° C to 125 ° C
- Issued Date
- 2024-12
- Citation
- IEEE Journal of Solid-State Circuits, v.59, no.12, pp.4057 - 4067
- Type
- Article
- Author Keywords
- Current reference ; process-voltage-temperature (PVT) invariance ; sub-range detector ; sub-ranging ; temperature coefficient (TC) ; TC-adjustable current source
- Keywords
- INSTRUMENTATION AMPLIFIER ; 3-SIGMA INACCURACY ; REFERENCE CIRCUIT ; COMPENSATION ; SUPPRESSION ; FEEDBACK ; DESIGN ; SENSOR ; CMOS BANDGAP REFERENCE ; NOISE
- ISSN
- 0018-9200
- Abstract
-
This article presents a sub-ranging current reference with a low-temperature coefficient (TC) across a wide temperature range. By using a TC-adjustable current source and a process-insensitive sub-range detector, the impact of second-order TC can be reduced by nearly fourfold, without any discontinuities at the subrange boundaries. Implemented in a 0.18-μ m CMOS process, the proposed current reference achieves an average TC of 11.4-ppm/°C across from -20 °C to 125 °C, obtained from 45 samples across five process corners without chip-by-chip calibration. The proposed current source exhibits low line and load sensitivities of 365 and 181 ppm/V, respectively, and an integrated noise of 38.9 pArms within a 10-Hz bandwidth. © 2024 IEEE.
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- Publisher
- Institute of Electrical and Electronics Engineers
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Related Researcher
- Lee, Junghyup이정협
-
Department of Electrical Engineering and Computer Science
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